“Noise performance of frequency modulation Kelvin force microscopy”,  H. Diesinger, D. Deresmes and T. Mélin, Beilstein Journal of Nanotechnology, Beilstein J. Nanotechnol. 2014, 5, 1–18.

“Doped semiconductor nanocrystal junctions”, Ł. Borowik, D. Deresmes, T. Mélin, T. Nguyen-Tran and P. Roca i Cabaroccas, J. Appl. Phys. 114 204305 (2013).

“Surface and Intrinsic Conduction Properties of Au-catalyzed Si Nanowires”,  Ł. Borowik, I. Florea, D. Deresmes, O. Ersen, D. Hourlier, and T. Mélin, J. Phys. Chem. C 116, 6601−6607 (2012).

“Characterization of ion/electron beam induced deposition of electrical contacts at the sub-µm scale”, D. Brunel, D. Troadec, D. Hourlier, D. Deresmes, M. Zdrojek, and T. Mélin, Microelectronic Engineering 88 1569–1572 (2011).

“Quantitative (artefact-free) surface potential measurements using Kelvin Force Microscopy”, T. Mélin, S. Barbet, H. Diesinger, D. Théron and D. Deresmes, Review of Scientific Instruments, Note, 82, 036101 (2011).

“Capacitive Crosstalk in AM-Mode KPFM ”, H. Diesinger, D. Deresmes and T. Mélin, book chapter in “Kelvin probe force microscopy”, Th. Glatzel and S. Sadewasser Editors, Springer-Verlag, pp. 25-44, ISBN: 978-3-642-22565-9 (2011).

“Mapping charge transfers between quantum levels using noncontact atomic force microscopy”, Ł. Borowik, K. Kusiaku, D. Deresmes, D. Théron, H. Diesinger, T. Mélin, T. Nguyen-Tran and P. Roca i Cabarrocas, Phys. Rev. B 82 073302 (2010).

“Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning of PMMA by Kelvin Force Microscopy”, E Palleau, L Ressier, Ł Borowik and T Mélin, Nanotechnology 21 225706 (2010).

“Imaging the operation of a carbon nanotube charge sensor at the nanoscale”, D. Brunel, A. Mayer, and T. Mélin, ACS Nano, 2010, 4 (10), pp 5978–5984.

“Frequency dependent rotation and translation of nanowires in liquid environment”, M. Marczak, D. Hourlier, T. Mélin, L. Adamowicz, and H. Diesinger, Applied Physics Letters 96 233502 (2010).

“Calculating Kelvin Force Microscopy Signals From Static Force Fields”, Łukasz Borowik, Koku Kusiaku, Didier Théron, and Thierry Mélin, Applied Physics Letters, 96 103119 (2010).

“Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes”, T. Mélin, M. Zdrojek, D. Brunel, book chapter, in “Scanning Probe Microscopy in Nanoscience and Nanotechnology”, Springer-Verlag, Bhushan Editor, ISBN: 978-3-642-03534-0 (2010).

« Traveling wave dielectrophoresis micropump based on the dispersion of a capacitive electrode layer », Marcin Marczak and Heinrich Diesinger, J. Appl. Phys. 105 , 124511 (2009).